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Measurement of temperature-dependent relaxation oscillation frequency and linewidth enhancement factor of a 1550 nm VCSEL

Khan, NA and Schires, K and Hurtado, A and Henning, ID and Adams, MJ (2013) 'Measurement of temperature-dependent relaxation oscillation frequency and linewidth enhancement factor of a 1550 nm VCSEL.' IEEE Journal of Quantum Electronics, 49 (11). 990 - 996. ISSN 0018-9197

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Abstract

In this paper, we present detailed measurements of the temperature- dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a temperature range of -20 °C to 60 °C.. Comparison is made between the experimental observations and theoretical predictions for similar VCSELs and with those different in operating wavelength and/or materials. © 1965-2012 IEEE.

Item Type: Article
Subjects: Q Science > QA Mathematics > QA75 Electronic computers. Computer science
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Science and Health > Computer Science and Electronic Engineering, School of
Depositing User: Jim Jamieson
Date Deposited: 11 Jan 2015 16:01
Last Modified: 17 Aug 2017 17:42
URI: http://repository.essex.ac.uk/id/eprint/12258

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