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Exploring ICMetrics to detect abnormal program behaviour on embedded devices

Zhai, Xiaojun and Appiah, Kofi and Ehsan, Shoaib and Howells, Gareth and Hu, Huosheng and Gu, Dongbing and McDonald-Maier, Klaus (2015) Exploring ICMetrics to detect abnormal program behaviour on embedded devices. Journal of Systems Architecture, 61 (10). pp. 567-575. DOI https://doi.org/10.1016/j.sysarc.2015.07.007



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