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Semi-structured Interview Measure of Stigma (SIMS) in psychosis: Assessment of psychometric properties

Wood, Lisa and Burke, Eilish and Byrne, Rory and Enache, Gabriela and Morrison, Anthony P (2016) 'Semi-structured Interview Measure of Stigma (SIMS) in psychosis: Assessment of psychometric properties.' Schizophrenia Research, 176 (2-3). 398 - 403. ISSN 0920-9964

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Stigma is a significant difficulty for people who experience psychosis. To date, there have been no outcome measures developed to examine stigma exclusively in people with psychosis. The aim of this study was develop and validate a semi-structured interview measure of stigma (SIMS) in psychosis. The SIMS is an eleven item measure of stigma developed in consultation with service users who have experienced psychosis. 79 participants with experience of psychosis were recruited for the purposes of this study. They were administered the SIMS alongside a battery of other relevant outcome measures to examine reliability and validity. A one-factor solution was identified for the SIMS which encompassed all ten rateable items. The measure met all reliability and validity criteria and illustrated good internal consistency, inter-rater reliability, test retest reliability, criterion validity, construct validity, sensitivity to change and had no floor or ceiling effects. The SIMS is a reliable and valid measure of stigma in psychosis. It may be more engaging and acceptable than other stigma measures due to its semi-structured interview format.

Item Type: Article
Uncontrolled Keywords: Stigma, Psychosis, Schizophrenia, Semi-structured interview, Psychometrics
Subjects: R Medicine > RA Public aspects of medicine > RA790 Mental Health
Divisions: Faculty of Science and Health > Health and Social Care, School of
Depositing User: Elements
Date Deposited: 01 May 2018 15:00
Last Modified: 01 May 2018 15:00

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