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Constraint-based test-scheduling of embedded microprocessors

Bartzoudis, N and Tantsios, V and McDonald-Maier, K (2008) Constraint-based test-scheduling of embedded microprocessors. In: UNSPECIFIED, ? - ?.

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Abstract

Test scheduling is a key aspect in the automation of embedded microprocessors self-testing. This paper presents a self-testing framework targeting the LEON3 embedded microprocessor with built-in test-scheduling features. The proposed design exploits existing postproduction test sets, designed for software-based testing of embedded microprocessors. The framework also includes a constraint-based approach of test-routine scheduling. The initial results show that the test execution time could be dynamically scaled by the test selection algorithm. The scheduler itself adds insignificant overheads in terms of execution cost and code size.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Published proceedings: Proceedings of the Argentine School of Micro-Nanoelectronics, Technology and Applications 2008, EAMTA
Subjects: Q Science > QA Mathematics > QA75 Electronic computers. Computer science
Divisions: Faculty of Science and Health > Computer Science and Electronic Engineering, School of
Depositing User: Clare Chatfield
Date Deposited: 19 Sep 2013 09:49
Last Modified: 17 Aug 2017 17:59
URI: http://repository.essex.ac.uk/id/eprint/6882

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