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Dynamic scheduling of test routines for efficient online self-testing of embedded microprocessors

Bartzoudis, N and Tantsios, V and McDonald-Maier, K (2008) Dynamic scheduling of test routines for efficient online self-testing of embedded microprocessors. In: UNSPECIFIED, ? - ?.

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Abstract

This paper presents a self-testing framework targeting the LEON3 embedded microprocessor with built-in test-scheduling features. The proposed design exploits existing postproduction test sets, designed for software-based testing of embedded microprocessors. The framework also includes a constraint-based approach of test-routine scheduling. The initial results show that the test execution time could be dynamically scaled by the test selection algorithm. ©2008 IEEE.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Published proceedings: Proceedings - 14th IEEE International On-Line Testing Symposium, IOLTS 2008
Subjects: Q Science > QA Mathematics > QA75 Electronic computers. Computer science
Divisions: Faculty of Science and Health > Computer Science and Electronic Engineering, School of
Depositing User: Clare Chatfield
Date Deposited: 19 Sep 2013 09:09
Last Modified: 17 Aug 2017 17:59
URI: http://repository.essex.ac.uk/id/eprint/6893

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