Conference or Workshop Item

Aslam, Bilal and Saha, Sangeet and Khanam, Zeba and Zhai, Xiaojun and Ehsan, Shoaib and Stolkin, Rustam and McDonald-Maier, Klaus (2020) Gamma-induced Degradation Analysis of Commercial off-the-shelf Camera Sensors. In: 2019 IEEE SENSORS, 2019-10-27 - 2019-10-30, Montreal, QC, Canada.

Aslam, Bilal and Saha, Sangeet and Zaffar, Mubariz and Ehsan, Shoaib and Zhai, Xiaojun and Cazzaniga, Carlo and Frost, Cristopher and McDonald-Maier, Klaus and Stolkin, Rustam (2019) Measuring the Degradation of Commercial Cameras Under Fast Neutron Beam. In: Single Event Effects (SEE) Symposium coupled with the Military and Aerospace Programmable Logic Devices (MAPLD) Workshop, 2019-05-20 - 2019-05-23, San Diego, CA. (Unpublished)