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Measurement of Temperature-Dependent Relaxation Oscillation Frequency and Linewidth Enhancement Factor of a 1550 nm VCSEL

Khan, Nadir Ali and Schires, Kevin and Hurtado, Antonio and Henning, Ian D and Adams, Michael J (2013) Measurement of Temperature-Dependent Relaxation Oscillation Frequency and Linewidth Enhancement Factor of a 1550 nm VCSEL. IEEE Journal of Quantum Electronics, 49 (11). pp. 990-996. DOI https://doi.org/10.1109/jqe.2013.2282759



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Full text not available from this repository. http://dx.doi.org/10.1109/jqe.2013.2282759

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