Constraint-based test-scheduling of embedded microprocessors

Test scheduling is a key aspect in the automation of embedded microprocessors self-testing. This paper presents a self-testing framework targeting the LEON3 embedded microprocessor with built-in test-scheduling features. The proposed design exploits existing postproduction test sets, designed for software-based testing of embedded microprocessors. The framework also includes a constraint-based approach of test-routine scheduling. The initial results show that the test execution time could be dynamically scaled by the test selection algorithm. The scheduler itself adds insignificant overheads in terms of execution cost and code size.