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Items where Author is "Chen, Xin"

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Article

Lu, Yufan and Chen, Xin and Zhai, Xiaojun and Saha, Sangeet and Ehsan, Shoaib and Su, Jinya and McDonald-Maier, Klaus (2021) 'A Fast Simulation Method for Analysis of SEE in VLSI.' Microelectronics Reliability, 120. ISSN 0026-2714 (In Press)

This list was generated on Mon Sep 20 18:41:58 2021 BST.