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Items where Author is "Chen, Xin"

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Lu, Yufan and Chen, Xin and Zhai, Xiaojun and Saha, Sangeet and Ehsan, Shoaib and Su, Jinya and McDonald-Maier, Klaus (2021) A Fast Simulation Method for Analysis of SEE in VLSI. Microelectronics Reliability, 120. p. 114110. DOI https://doi.org/10.1016/j.microrel.2021.114110 (In Press)

This list was generated on Fri Feb 23 00:34:27 2024 GMT.