Wachter, Eduardo and Kasap, Server and Zhai, Xiaojun and Ehsan, Shoaib and McDonald-Maier, Klaus (2020) A Framework and Protocol for Dynamic Management of Fault Tolerant Systems in Harsh Environments. In: 26th IEEE International Symposium on On-Line Testing and Robust System Design 2020, 2020-07-13 - 2020-07-15, Naples, Italy / Virtual. (In Press)
Wachter, Eduardo and Kasap, Server and Zhai, Xiaojun and Ehsan, Shoaib and McDonald-Maier, Klaus (2020) A Framework and Protocol for Dynamic Management of Fault Tolerant Systems in Harsh Environments. In: 26th IEEE International Symposium on On-Line Testing and Robust System Design 2020, 2020-07-13 - 2020-07-15, Naples, Italy / Virtual. (In Press)
Wachter, Eduardo and Kasap, Server and Zhai, Xiaojun and Ehsan, Shoaib and McDonald-Maier, Klaus (2020) A Framework and Protocol for Dynamic Management of Fault Tolerant Systems in Harsh Environments. In: 26th IEEE International Symposium on On-Line Testing and Robust System Design 2020, 2020-07-13 - 2020-07-15, Naples, Italy / Virtual. (In Press)
Abstract
Robots can be used to deal with hazardous materials like nuclear waste. Unfortunately, electronic components are also susceptible to radiation effects. Current proposals to tackle this issue solve only parts of the problems for the specific scenarios and the specific types of radiation. At the same time, current computational devices should provide run-time capabilities to monitor and adapt to different situations. In this paper, we target a possible solution presenting a framework which provides the flexibility to employ fault-tolerant techniques on distributed systems. As proof of concept, we target a fault-tolerant technique to extend the operating time of systems in harsh environments. Results show a very low overhead, of few microseconds, to execute a majority voter with replicated tasks.
Item Type: | Conference or Workshop Item (Paper) |
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Additional Information: | Published proceedings: _not provided_ |
Uncontrolled Keywords: | fault tolerance; spatial redundancy; software redundancy; SEE; SEU; soft errors; TID effects |
Divisions: | Faculty of Science and Health Faculty of Science and Health > Computer Science and Electronic Engineering, School of |
SWORD Depositor: | Unnamed user with email elements@essex.ac.uk |
Depositing User: | Unnamed user with email elements@essex.ac.uk |
Date Deposited: | 17 Jun 2020 15:59 |
Last Modified: | 12 Dec 2024 13:04 |
URI: | http://repository.essex.ac.uk/id/eprint/27886 |
Available files
Filename: PID6471759.pdf